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FACILITIES - HARDWARE
Powder X-Ray Diffraction (XRD)
XRD are the primary tool for identifying the crystalline components of solids.
At its most basic, XRD diffraction peaks are used to fingerprint the phases present.
Successively more complex data analysis will yield unit cell parameters, crystallite
size, weight proportions and ultimately crystal structure refinement.
Shimadzu (x2)
X-ray
tube:
Cu, 1.0 x 10mm
Power:
2.0kW
Goniometer:
Vertical type (185 mm)
Minimum
step angle: 0.002º(2Theta)
Scan
Speed:
0.1º to 50º/min (2Theta)
Scan
mode:
Theta/2Theta linkage mode
Divergence
slit:
0.5º, 1º, 2º, 0.05mm
Scattering
slit:
0.5º, 1º, 2º
Receiving
slit :
0.15mm, 0.3mm
Detector:
Scintillation counter
Database
:
JCPDS
Rigaku
X-ray
tube:
Cu, 1.0 x 10mm
Power:
2.0kW
Goniometer:
Vertical type (185 mm)
Scan
Speed:
0.001º to 100º/min (Theta/2Theta)
Step
scanning width: 0.001º
to 90º/min (Theta/2Theta)
Scan
mode:
Theta/2Theta linkage mode
Divergence
slit:
0.5º,1º,2º,0.05mm
Scattering
slit:
0.5º,1º,2º
Receiving
slit:
0.05, 0.15, 0.3, 0.6mm
Detector:
Scintillation counter
Database:
JCPDS
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Transmission electron microscopy can be used either for diffraction, or when a fine
probe is employed, microanalysis and is an important tool for innovation in nanotechnology
and biosciences. Novel materials such as carbon nanotubes, semiconductors and ceramics,
as well as basic research in medicine and biology, nanometer-scale inspection, evaluation
and analysis all benefit through the application TEM techniques. FACTS has available two
TEMs. One is configured with an ultrahigh resolution polepiece and is dedicated to atomic
resolution imaging. The other is equipped with a field emission source and scanning
transmission capable and is used primarily for chemical analysis.
JEM-2010F
The JEM-2010 is equipped with a field emission electron gun(FEG) that produces high
brightness(100 times greater than LaB6 tip) and is highly stable. This feature is
essential for nano-scale ultrahigh resolution and analysis. The JEM-2010 incorporates
a scanning transmission electron microscope (STEM) attachment and an energy dispersive
X-ray spectrometer(EDS) system allowing simple and integrated date acquisition. As the
electron flux is high not all materials can withstand the energy deposition, therefore
potential users should consult with FACTS whether the machine is suitable for their research.
Point
Resolution:
1.9 Å
Lattice
Resolution:
1 Å
Accelerating
Voltage:
200 kV
Magnification:
50x to 1,500,000x
Electron
Gun:
Emission: ZrO/W(100) Schottkey
Vacuum pressure: 10-8 Pa
JEM-2010
Operating on the basic principles of the light microscope, the TEM takes advantage of
the much shorter wavelengths of electron beams vs light beams, providing resolving powers
on the order of 2 Å, rather than 2000 Å for the light microscope. The TEM permits the
routine imaging of atomic columns, allowing materials researchers to monitor and design
materials with custom-tailored properties. Currently, the JEM-2010 has been upgraded
with UHR pole piece and combined with relatively gentle LaB6 electron source is well
suited to the study of thin cross sections of inorganic materials.
Point
Resolution:
1.9 Å
Accelerating
Voltage: 200 kV
Magnification: 50x to 1,200,000x
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The scanning electron microscope is a ubiquitous tool of science whether the topic
be medical or materials research, environmental or forensic problem solving and so
on. At its most basic, SEM offers images with superior resolution and depth of field
compared to light microscopy. In addition, by analyzing the various signals emanating
from the specimen compositional and crystallographic information may be extracted.
Most appealingly, basic operation of an SEM is readily mastered by users. FACTS
operating 4 SEMs for teaching and research.
JSM-6340F
Resolution:
3.0nm
Accelerating Voltage:
0.5 to 30keV
Magnification:
50x to 200,000x
Electron Source:
Cold cathode FEG
X-ray Analysis:
Link ISIS 300
JSM-6360
Resolution:
4.0nm
Accelerating Voltage:
0.5 to 30keV
Magnification:
50x to 100,000x
Electron Source:
Tungsten
Other Functions:
Auto focusing & astigmatism
X-ray Analysis:
JED-2300
JSM-5410LV
Resolution:
3.5nm
Accelerating Voltage:
0.5 to 30keV
Magnification:
50x to 100,000x
Electron Source:
Tungsten
X-ray Analysis:
Link ISIS 300
Quantitative
X-ray mapping and line scanning
Electron Backscatter Diffraction
JSM-5310
Resolution:
4.0nm
Accelerating Voltage:
0.5 to 30keV
Magnification:
50x to 100,000x
Electron Source:
Tungsten
X-ray Analysis:
Link ISIS 300
Quantitative
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Specimen Preparation
Precision Ion Polishing System Gatan 691 (x2)
The PIPS is a completely self-contained, compact, bench-top system designed to produce
high quality TEM specimens having exceptionally large, clean, electron transparent areas.
Ion polishing is done by two variable angle, miniature Penning ion guns. The operating
angle of each gun (�0º) is independent of one another and both have the ability to
accurately center the beam onto the specimen at any angle within this range. An optical
stereo microscope may also be used to inspect the specimen in its working position at
any time during the thinning process, and also to achieve very precise control over the
final stage of specimen thinning. Specimen contamination is reduced by using an oil free
vacuum system.
PIPS
Ion source :
Penning type with miniature
rare earth magnets
Ion energy :
1keV to 6keV
Gas throughout :
0.1 cc of argon/minute per gun
Beam Diameter :
about 350 µm FWHM specimen at 5keV
Specimen size :
3mm diameter, dimpled to a thickness of
<10 µm at specimen center.
Specimen
rotation : 1 to 6 rpm
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PW2400 XRF System
XRF is an analytical method to determine the chemical composition of all kinds of
materials. The materials can in solid, powder or liquid (but this last type is not presently
available on the FACTS machine). The method is fast, accurate (even when used in
standardless mode) and non-destructive and usually requires only a minimum of sample
preparation. Applications are very broad and include the metal, cement, polymer, plastic
and food industries, along with mining, mineralogy and geology, and environmental
analysis of water and waste materials. Detection limits in solids are dependant on the
‘matrix’ but typically are <50ppm for most metals.
PW2400 XRF System Specification:
X-ray tube :
Type: Super-Sharp, end-window
Anode: Rhodium (Rh)
Rating: 60kV, 125mA, 3kW maximum
Goniometer :
Type: theta/2theta decoupled, with Direct Optical Position Sensors (DOPS)
Scanning speed: 0.0001deg to 2deg, 2 theta/s, selectable
Slewing speed : 40deg 2 theta/s
Angular accuracy: 0.0025deg theta, 2 theta
Angular reproducibility: 0.0001deg theta, 2 theta
Detectors :
Scintillation: Angular range: 0deg to 104deg 2 theta)
Flow : Angular range: 13deg to 148deg 2 theta
Counting Electronics :
Type : Multi-channel analyzer)
Count rate: 2000kcps, maximum (flow)theta
Count rate: 1000kcps, maximum (scintillation sealed)
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PHI 5600 XPS system
XPS is widely-used analytical technique for investigating the chemical composition of solid surfaces
including bulk powders, thin films and polymers. Surface analysis by ESCA involves irradiation of the solid
in vacuum with mono-energetic soft x-rays and sorting the emitted electrons by energy. The spectrum obtained
is a plot of the number of emitted electrons per energy interval versus their binding energy (or kinetic
energy). Since the mean free path of the electrons is very small, the electrons which are detected originate
form only the top few atomic layers. Quantitative data can be obtained from the peak heights or areas and
identification of chemical states often can be made from the exact positions and separations of the peaks, as
well as from certain spectral contours.
PHI 5600 XPS system specification:
X-ray Source:
PHI Model 04-500, dual anode source
Anode Material: Mg: 1253.6eV & Al: 1486.6eV
Energy range: Variable; 4kV to 15kV
Power: 300W
Ion Gun :
PHI Model 04-303 Differentially Pumped Ion Gun
Type: Electron Impact
Beam Voltage: Variable, up to 3kV
Gas : Argon
Differential Pumping: <5x10- 8 torr in chamber while sputtering with turbo molecular pump
Precision Energy Analyzer:
Type : Spherical capacitor analyzer (SCA)
Lens: Omni-Focus IV
Detector: Multi-Channel Detector
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